Vlsisoc Design For Reliability Security And Low Power 23rd Ifip Wg 105ieee International Conference On Very Large Scale Integration Vlsisoc 2015 Daejeon Korea October 57 2015 Revised Selected Papers 1st Edition Youngsoo Shin by Youngsoo Shin, Chi Ying Tsui, Jae-joon Kim, Kiyoung Choi, Ricardo Reis (eds.) 9783319460963, 9783319460970, 331946096X, 3319460978 instant download after payment.

This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.