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Istfa 2001 Proceedings Of The 27th International Symposium For Testing And Failure Analysis 1st Edition Asm International

  • SKU: BELL-5307888
Istfa 2001 Proceedings Of The 27th International Symposium For Testing And Failure Analysis 1st Edition Asm International
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Istfa 2001 Proceedings Of The 27th International Symposium For Testing And Failure Analysis 1st Edition Asm International instant download after payment.

Publisher: ASM International
File Extension: PDF
File size: 42.48 MB
Pages: 485
Author: ASM International
ISBN: 9780871707468, 0871707462
Language: English
Year: 2001
Edition: 1

Product desciption

Istfa 2001 Proceedings Of The 27th International Symposium For Testing And Failure Analysis 1st Edition Asm International by Asm International 9780871707468, 0871707462 instant download after payment.

Proceedings of the 27th International Symposium for Testing and Failure Analysis, 11-15 November 2001, Santa Clara, California.
This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis.
The CD-ROM provides the complete content of the book in searchable Adobe Acrobat PDF format.
Contents include:
Advanced techniques Packaging Backside analysis Scanning probe microscopy Focused ion beam (FIB) techniques Failure analysis of micro-electromechanical systems (MEMS) Yield improvement Discretes Defect-based testing Case histories

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