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Istfa 2003 Proceedings Of The 29th International Symposium For Testing And Failure Analysis 26 November 2003 Santa Clara Convention Center Santa Clara California Moore

  • SKU: BELL-5307890
Istfa 2003 Proceedings Of The 29th International Symposium For Testing And Failure Analysis 26 November 2003 Santa Clara Convention Center Santa Clara California Moore
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Istfa 2003 Proceedings Of The 29th International Symposium For Testing And Failure Analysis 26 November 2003 Santa Clara Convention Center Santa Clara California Moore instant download after payment.

Publisher: A S M International
File Extension: PDF
File size: 93.04 MB
Pages: 533
Author: Moore, Thomas M
ISBN: 9780871707888, 9781615030866, 0871707888, 1615030867
Language: English
Year: 2003

Product desciption

Istfa 2003 Proceedings Of The 29th International Symposium For Testing And Failure Analysis 26 November 2003 Santa Clara Convention Center Santa Clara California Moore by Moore, Thomas M 9780871707888, 9781615030866, 0871707888, 1615030867 instant download after payment.

This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis. The CD-ROM presents the complete content of the book in fully searchable Adobe Acrobat PDF format. Contents: Fault Isolation of the Electrical Fail over Sample Presentation; Imaging and Material Analysis; Failure Analysis Process Flows on Individual Components; System-Level Performance; Manufacturing yield Enhancements; Packaging Issues and Solutions; Hot Topics such as Optical Probing and Tester-Driven Failure Analysis

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