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Istfa 2006 Proceedings Of The 32nd International Symposium For Testing And Failure Analysis 1st Edition Asm

  • SKU: BELL-5307896
Istfa 2006 Proceedings Of The 32nd International Symposium For Testing And Failure Analysis 1st Edition Asm
$ 31.00 $ 45.00 (-31%)

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Istfa 2006 Proceedings Of The 32nd International Symposium For Testing And Failure Analysis 1st Edition Asm instant download after payment.

Publisher: ASM International
File Extension: PDF
File size: 104.64 MB
Pages: 524
Author: ASM
ISBN: 9780871708441, 9781615030897, 0871708442, 1615030891
Language: English
Year: 2006
Edition: 1

Product desciption

Istfa 2006 Proceedings Of The 32nd International Symposium For Testing And Failure Analysis 1st Edition Asm by Asm 9780871708441, 9781615030897, 0871708442, 1615030891 instant download after payment.

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community.
The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand and eliminate electronic device and system failures.
Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results

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