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Istfa 2008 Conference Proceedings From The 34th International Symposium For Testing And Failure Analysis 1st Edition Asm International

  • SKU: BELL-5307900
Istfa 2008 Conference Proceedings From The 34th International Symposium For Testing And Failure Analysis 1st Edition Asm International
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Istfa 2008 Conference Proceedings From The 34th International Symposium For Testing And Failure Analysis 1st Edition Asm International instant download after payment.

Publisher: ASM International
File Extension: PDF
File size: 82.8 MB
Pages: 528
Author: ASM International, ASM International
ISBN: 9780871707147, 0871707144
Language: English
Year: 2008
Edition: 1

Product desciption

Istfa 2008 Conference Proceedings From The 34th International Symposium For Testing And Failure Analysis 1st Edition Asm International by Asm International, Asm International 9780871707147, 0871707144 instant download after payment.

November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community.
The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results

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